New Imaging X-Ray Sensor Technology for Real-Time Nondestructive Testing

X-ray imaging is an important technique which is used in variety of applications such as nondestructive evaluation, radiology in medicine, astronomical observations, X-ray diffraction for materials studies, and others. The ability of X-rays to penetratedeep in to matter allows investigation of interior components with possibility of real-time dynamic studies. However, while significant advances have been made in X-ray sources as well as image processing steps, the X-ray detectors remain a limiting stepin many of applications. Important requirements for the X-ray detectors used in such applications include large area (~ 20 cm x 20 cm), high resolution (100-200 um), wide dynamic range (10~), high sensitivity, compact design, and low cost. Ability toprovide real-time images is an additional requirement in some applications. None of the present detectors satisfy all these requirements. To address this situation, we have proposed to develop a solid state, large area, high resolution imaging detector bycombining the semiconductor film (lead iodide, PbI2) technology being developed at RMID with the large format amorphous silicon (a-Si:H) readout technology. The detectors would be capable of performing static as well as dynamic imaging. We will explore theuse of these detectors in NDE and medical imaging applications in the Phase II research.The proposed detectors would find wide usage in non destructive evaluation and medical radiology markets. A conservative estimate of the combined size of these markets is about $600 million/year. Additional applications such as astronomy, crystallography,radionuclide imaging, and radiation therapy imaging will also be addressed by the detector proposed here.