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High Resolution X-Ray Imaging Sensor for Real Time Nondestructive Evaluation

Award Information
Agency: Department of Defense
Branch: Air Force
Contract: N/A
Agency Tracking Number: 26149
Amount: $60,000.00
Phase: Phase I
Program: SBIR
Solicitation Topic Code: N/A
Solicitation Number: N/A
Timeline
Solicitation Year: N/A
Award Year: 1994
Award Start Date (Proposal Award Date): N/A
Award End Date (Contract End Date): N/A
Small Business Information
44 Hunt Street
Watertown, MA 02172
United States
DUNS: N/A
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 Vivek Nagarkar
 (617) 926-1167
Business Contact
Phone: () -
Research Institution
N/A
Abstract

The advanced materials and sophisticated designs of metal matrix composite components are being used in modern aircraft designs. To detect flaws and other integrity-reducing anomalies in these new materials and to assure the component reliability and accurate failure rate predictions, nondestructive evaluation (NDE) using X-ray inspection is becoming indispensable. Currently used X-ray imaging sensors primarily limit both the ability of radiographic and computed tomographic (CT) procedures to produce high quality images and also scan times adequate to achieve real-time inspection throughput. Using conventional X-ray sensors, such as Tb2O3 scintillators, there exists a problematic tradeoff between the thickness and spatial resolution due to laternal light spreading. The scanning speed of these systems is further limited by persistence effects of the sensor. To address these needs, we propose to develop a novel, large area, microstructured scintillator plate to be incorporated into a CT/radiography imaging system based on a large area charge-coupled device currently used for NDE of aerospace components. This microstructured X-ray sensor suppresses lateral spreading of the scintillation light even when the structure is made very thick. For the X-ray sources typically used in nondestructive testing procedures, this sensor will provide high resolution with high detection efficiency together with fast scanning speed, allowing the full potential of NDE systems to be realized. OPTION TASK: None submitted.

* Information listed above is at the time of submission. *

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