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High Resolution Digital Imaging X-ray Detectors

Award Information
Agency: Department of Health and Human Services
Branch: National Institutes of Health
Contract: 4R42CA110192-02
Agency Tracking Number: CA110192
Amount: $2,183,056.00
Phase: Phase II
Program: STTR
Solicitation Topic Code: N/A
Solicitation Number: N/A
Timeline
Solicitation Year: N/A
Award Year: 2005
Award Start Date (Proposal Award Date): N/A
Award End Date (Contract End Date): N/A
Small Business Information
Aguila Technologies, Inc. 310 Via Vera Cruz
San Marcos, CA 92069
United States
DUNS: N/A
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 M CAPOTE
 (760) 752-1199
 macapote@aguilatech.com
Business Contact
 M CAPOTE
Phone: (760) 752-1199
Email: MACAPOTE@AGUILATECH.COM
Research Institution
N/A
Abstract

DESCRIPTION (provided by applicant): The aim is to develop a high resolution, high contrast detector for digital x-ray imaging systems. The target detector would have a Detective Quantum Efficiency much greater than 80%, a limiting resolution of at least 10 lp/mm, ultra-low noise, linear response and a dynamic range of more than 14 bits. The proposal is to build such a detector by using CdZnTe crystals. The detector crystal is hybridized to a readout integrated circuit device that allows the signal to be collected efficiently, digitized and stored in a computer as an image matrix. The planned individual detector unit, designed for use in a slot scan system, has 192 stages in the scan direction and 384 columns in the non-scan direction. The detectors are planned to be mounted in a staggered array with overlap at the ends up to the full breast x-ray image width (approximately 25 cm) in the non-scan direction. The detector pixel pitch will be 50 microns with 100% fill factor. Compared to the present film systems, a reduction of patient dose by a factor of six can be achieved without loss of image quality. To achieve these objectives, in this proposal we plan to develop and demonstrate: a high quality and high spatial resolution bump bonding technique; an optimized readout IC for the CZT crystals; and a reliable, low-cost, high throughput technique to test and select high quality, high uniformity CZT crystals.

* Information listed above is at the time of submission. *

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