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Improved Silicon Drift Detector Coincidence Rejection for Digital Pulse Processors
Award Information
Agency: Department of Commerce
Branch: National Institute of Standards and Technology
Contract: SB1341-08-SE-0661
Agency Tracking Number: 313-08
Amount:
$90,000.00
Phase:
Phase I
Program:
SBIR
Solicitation Topic Code:
N/A
Solicitation Number:
N/A
Timeline
Solicitation Year:
N/A
Award Year:
2008
Award Start Date (Proposal Award Date):
N/A
Award End Date (Contract End Date):
N/A
Small Business Information
3500 Westgate Dr., Suite 403
Durham, NC
27707
United States
DUNS:
N/A
HUBZone Owned:
No
Woman Owned:
No
Socially and Economically Disadvantaged:
No
Principal Investigator
Name: Stefan Jeglinski
Phone: (919) 489-1757
Email: jeglin@4pi.com
Phone: (919) 489-1757
Email: jeglin@4pi.com
Business Contact
Phone: () -
Research Institution
N/A
Abstract
The recent emergence of the Silicon Drift detector (SDD), for use in Energy Dispersive x-ray Spectroscopy (EDS), has made possible x-ray event streams with input count rates in the range of 1-10 Mcps. Modern digital pulse processors are therefore required to run at fast time constants to achieve reasonable throughput; however, this causes significant coincidence artifacts to appear in the spectrum, thus complicating analysis. Phase I will design and demonstrate an improved coincidence rejection system based on 4pi's digital pulse processor development, and earlier pulse-shape analysis and recovery research.
* Information listed above is at the time of submission. *