DEFECT REDUCTION IN BULK 6H-SIC

Award Information

Agency: National Science Foundation	Branch: N/A	Award ID: 27339	Program Year/Program: 1997 / SBIR
Agency Tracking Number: 27339	Solicitation Year: N/A	Solicitation Topic Code: N/A	Solicitation Number: N/A

Small Business Information: Advanced Technologies/Laboratories Intl
Advanced Technologies/Lab Intl 20010 Century Blvd, Ste 500 Germantown, MD 20874 0111
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Woman-Owned: Yes

Minority-Owned: Yes

HUBZone-Owned: No

Phase 2: Fiscal Year: 1997

Title: DEFECT REDUCTION IN BULK 6H-SIC

Agency: NSF

Contract: N/A

Award Amount: $300,000.00

Abstract:
DUE TO ITS UNIQUE PROPERTIES AND ITS ABILITY TO BE PROCESSED ANALOGOUSLY TO SILICON, SILICON CARBIDE (SIC) WILL BE AN IMPORTANT HIGH TEMPERATURE, HIGH POWER, AND HIGH FREQUENCY ELECTRONIC MATERIAL. THE BARRIER TO THIS DEVELOPING TECHNOLOGY WAS THE AVAILABILITY OF 6H-SIC SUBSTRATES. HOWEVER, THESE SUBSTRATES ARE NOW PRODUCED IN EVER-INCREASING QUANTITIES AND THE NEW BARRIER IS THE QUALITY OF THESE SUBSTRATES. SYNCHROTRON WHITE BEAM X-RAY TOPOGRAPHY (SWBXT), AN INNOVATIVE AND NON-DESTRUCTIVE TECHNIQUE IN WHICH LOCAL DIFFERENCES IN DIFFRACTING POWER GIVE RISE TO IMAGE CONTRAST, IS UNIQUELY SUITED FOR DEFECT CHARACTERIZATION IN SIC. THE COMPREHENSIVE AND NONDESTRUCTIVE NATURE OF THIS TECHNIQUE MAKES IT AN OPTIMAL TOOL FOR RESEARCH AS WELL AS FOR QUALITY CONTROL IN A PRODUCTION ENVIRONMENT.

Principal Investigator:
Nicholas I Buchan
2037941100

Business Contact:

Small Business Information at Submission:

Advanced Technology Materials
7 Commerce Dr Danbury, CT 06810

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DUNS: N/A

Number of Employees: N/A

Woman-Owned: No

Minority-Owned: No

HUBZone-Owned: No