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Abductive Electronics Prognostic Tool (ADEPT)

Award Information
Agency: Department of Defense
Branch: Air Force
Contract: N/A
Agency Tracking Number: 36180
Amount: $99,995.00
Phase: Phase I
Program: SBIR
Solicitation Topic Code: N/A
Solicitation Number: N/A
Timeline
Solicitation Year: N/A
Award Year: 1997
Award Start Date (Proposal Award Date): N/A
Award End Date (Contract End Date): N/A
Small Business Information
1575 State Farm Blvd., Suites 1 And 2
Charlottesville, VA 22911
United States
DUNS: N/A
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 Gerard J. Montgomery
 (804) 977-0686
Business Contact
Phone: () -
Research Institution
N/A
Abstract

AbTech Corporation proposes to apply its unique Statistical Network ModelingTM technology to develop a non contact prognostic assessment tool that 1) acquires, processes, and analyzes electronic radiated signal data, 2) learns the expected characteristics and patterns of specific radiated signals measured from microelectronic semiconductor devices using AbTech's statistical network modeling technology, and 3) applies these learned models to assess and predict the health and time to failure of electronic equipment and identify unexpected leagues and concerning trends in semiconductor performance. The proposed system, called the Abductive Electronics Prognostic Tool (ADEPT), will be able to identify and interpret complex relationships in electronic equipment behavior to substantially reduce the likelihood of incipient failures and semiconductor degradation being undetected until they cause significant damage to critical electronic equipment. ADEPT will automatically analyze expected versus actual values of specified radiated signals, and indications of the significance of the differences. It will automatically learn how to detect and isolate anomalous equipment behavior based on measurable radiated signal data from semiconductor devices. The objectives of this effort are to prototype ADEPT and to demonstrate its exceptional potential value on selected measurable signals provided by the Center for Semicustom Integrated Systems (CSIS) at the University of Virginia.

* Information listed above is at the time of submission. *

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