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Scanning SCOTS Measurements for Corrective Optics

Award Information
Agency: Department of Defense
Branch: Navy
Contract: N68936-13-C-0163
Agency Tracking Number: N132-124-1036
Amount: $79,847.00
Phase: Phase I
Program: SBIR
Solicitation Topic Code: N132-124
Solicitation Number: 2013.2
Timeline
Solicitation Year: 2013
Award Year: 2013
Award Start Date (Proposal Award Date): 2013-09-30
Award End Date (Contract End Date): 2014-04-01
Small Business Information
490 S. Edgeside Ave.
Tucson, AZ -
United States
DUNS: 835391496
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 Jim Burge
 Chief Technology Officer
 (520) 334-5937
 jburge@arizonaopticalsystems.com
Business Contact
 Martin Valente
Title: President
Phone: (520) 303-3472
Email: mvalente@arizonaopticalsystems.com
Research Institution
 Stub
Abstract

We propose to develop an optical system to measure arch-shaped corrective optics using the Software Configurable Optical Tests System (SCOTS) developed by the proposing team for freeform aspherics. The full arch is measured by scanning subaperture regions and stitching the data. SCOTS measurements use video images of an optic under test illuminated with modulated patterns from a digital display. Powerful software and careful calibration provide measurements of wavefront slope with sub-microradian precision. The slopes are integrated to provide surface topology. We will apply this robust new technology for measuring the optical effect of light transmitted through subaperture regions on the corrector optics. These measurements are scanned and stitched together to provide a measurement of the full arch-shaped optic. The large dynamic range of the SCOTS test accommodates the complex shapes and many degrees departure from parallelism. Carefully calibrated cameras provide simultaneous measurements of both surfaces with microradian slope resolution. The advantages of this system are clear. A 25-mm wide, 100-mm tall arch freeform aspheric corrector can be measured in a few minutes with 20 nm accuracy. Furthermore, this measurement technique can be readily extended with the addition of a roll axis for measuring high aspect domes.

* Information listed above is at the time of submission. *

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