You are here

Minority Carrier Lifetime Measurements in Strained Layer Superlattices

Award Information
Agency: Department of Defense
Branch: Defense Advanced Research Projects Agency
Contract: W911NF-09-C-0120
Agency Tracking Number: A09A-005-0131
Amount: $99,979.00
Phase: Phase I
Program: STTR
Solicitation Topic Code: A09A-T005
Solicitation Number: 2009.A
Timeline
Solicitation Year: 2009
Award Year: 2009
Award Start Date (Proposal Award Date): 2009-08-26
Award End Date (Contract End Date): 2010-02-22
Small Business Information
1405 4th Ave NW, Suite 345
Ardmore, OK 73401
United States
DUNS: 159048698
HUBZone Owned: No
Woman Owned: Yes
Socially and Economically Disadvantaged: Yes
Principal Investigator
 Daniel Johnstone
 Senior Research Scientist
 (405) 227-9414
 johnstone@amethystresearch.com
Business Contact
 Sallie Reddy
Title: President
Phone: (405) 227-9414
Email: admin@amethystresearch.com
Research Institution
 Texas State University
 Thomas H Myers
 
RF Mitte Building, 3206 Texas State University
San Marcos, TX 78666
United States

 (512) 245-6711
 Nonprofit College or University
Abstract

Type II strained layer superlattice (SLS) p-n diode arrays fabricated on domestic-source GaSb substrates are a promising route to meet the critical need within DoD for large area, large format array infrared detectors. However, current SLS material quality is limiting detector performance. A quantitative, cost effective and trusted evaluation technique for measuring the SLS minority carrier lifetime is critical to establishing a comprehensive development program for the SLS system. In Phase I we will develop an automated, variable temperature photoconductance decay (PCD) lifetime measurement system capable of measuring lifetimes in the range of 1 ns (existing SLS materials quality) up to 25 ms (anticipated long-term SLS quality). The system will also permit synergistic use of equipment components to allow various other techniques to be incorporated on a common platform, such as current transient spectroscopy and photo induced current transient spectroscopy. The appropriate combination with PCD lifetime measurements will provide an unprecedented, coordinated technique for materials evaluation. The program brings together teams from Amethyst Research, Texas State University and IntelliEPI. In Phase II a system will be built and fully evaluated to establish a sustainable product platform. The final product will comprise an Integrated Narrow-Bandgap Lifetime Assessment Platform (INLAP).

* Information listed above is at the time of submission. *

US Flag An Official Website of the United States Government