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Embedded Dual-Function Arc Fault Circuit Breaker/ Locator based on OSA

Award Information
Agency: National Aeronautics and Space Administration
Branch: N/A
Contract: NAS4-03002
Agency Tracking Number: 024220
Amount: $70,000.00
Phase: Phase I
Program: SBIR
Solicitation Topic Code: N/A
Solicitation Number: N/A
Timeline
Solicitation Year: N/A
Award Year: 2003
Award Start Date (Proposal Award Date): N/A
Award End Date (Contract End Date): N/A
Small Business Information
200 Greenleaf street
Fort Worth, TX 76107
United States
DUNS: N/A
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 Kartik Moorthy
 Principal Investigator
 (817) 872-1500
 Kartik.Moorthy@williams-pyro.com
Business Contact
 Brent Williams
Title: Vice President
Phone: (817) 872-1500
Email: Brent.Williams@williams-pyro.com
Research Institution
N/A
Abstract

This SBIR describes diagnostic and reasoning approaches that are applicable in a wide set of domains, specifically the design and development of Embedded Dual-Function Arc Fault Circuit Breaker/ Locator based on Open Systems Architecture for Aircraft Wiring Systems. An Embedded Locator And Breaker (ELaB) will be designed that will not only identify arc faults before they occur, but also provide a precise location of potential causes, such as insulation damages, that could lead to an arc. The ELaB will be a self-contained, portable test set based on open systems architecture, thus allowing state-of-the-art technologies such as Reflectometry Techniques to be integrated with existing Arc Fault Circuit Breakers (AFCB). Each ELaB will be based on VLSI/MEMS technology and will incorporate several systems on a microchip: a wiring testing and fault location system based on RF reflectometry techniques, a dynamic on-line wire failure analysis and diagnosis system based on Artificial Neural Network combined with signal processing techniques, and a switching system that automates the testing process for large bundles of multiple wires. Electromechanical adaptability of existing systems will allow on-board data transfer capabilities from wires under test to an on-board Automated Test System (ATS).

* Information listed above is at the time of submission. *

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