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Multi-Band Power Source for ITER Reflectometry

Award Information
Agency: Department of Energy
Branch: N/A
Contract: DE-FG02-09ER85544
Agency Tracking Number: 91449
Amount: $100,000.00
Phase: Phase I
Program: SBIR
Solicitation Topic Code: 56 a
Solicitation Number: DE-FOA-0000350
Timeline
Solicitation Year: 2010
Award Year: 2009
Award Start Date (Proposal Award Date): N/A
Award End Date (Contract End Date): N/A
Small Business Information
979 Second Street SE
Charlottesville, VA 22902
United States
DUNS: 788159445
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 Jeffrey Hesler
 Dr.
 (434) 297-3257
 Hesler@VADiodes.com
Business Contact
 Thomas Crowe
Title: Dr.
Phone: (434) 297-3257
Email: Crowe@VADiodes.com
Research Institution
N/A
Abstract

The technical requirements for the ITER LFS Reflectometer include a frequency range from 50 ¿ 170 GHz, a source power level of 150mW or more, and a frequency sweeping time of ten microseconds or less. Further, the various frequencies must be coupled simultaneously into a single circular waveguide, so that the reflectometer probes the same volume of the plasma with all frequencies and within the required sweep time. This project will demonstrate an all-solid-state source that achieves all of the above technical requirements. The approach is to break the frequency range into five frequency bands and use a combination of fundamental mode waveguide diplexers and a fundamental-to-multimode triplexer to couple the power from the five sources into a single circular waveguide. Commercial Applications and other Benefits as described by the awardeeIn addition to fusion applications, the high-power frequency-agile source should find use in radio-astronomy, chemical spectroscopy, atmospheric studies, plasma diagnostics, short range and secure communications, the detection of chemical and biological threats, and imaging systems. The application to imaging systems is particularly promising because terahertz waves, like microwaves, are able to penetrate a wide range of materials while maintaining a useful level of image resolution.

* Information listed above is at the time of submission. *

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