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NEW METHOD FOR MEASURING TRACE ELEMENTS IN II-VI SEMICONDUCTING MATERIALS

Award Information
Agency: Department of Defense
Branch: Army
Contract: N/A
Agency Tracking Number: 9249
Amount: $500,000.00
Phase: Phase II
Program: SBIR
Solicitation Topic Code: N/A
Solicitation Number: N/A
Timeline
Solicitation Year: N/A
Award Year: 1990
Award Start Date (Proposal Award Date): N/A
Award End Date (Contract End Date): N/A
Small Business Information
180 Zachary Rd - #5
Manchester, NH 03103
United States
DUNS: N/A
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 James R Valentine
 (603) 622-7660
Business Contact
Phone: () -
Research Institution
N/A
Abstract

MEASUREMENT OF CRITICAL TRACE LEVEL ELEMENTS IN SEMICONDUCTING MATERIALS MAY BE POSSIBLE USING A SPECIAL ATOMIC ABSORPTION SPECTROPHOTOMETRY TECHNIQUE. DIRECT VAPORIZATION OF SOLID SAMPLES COMBINED WITH A HIGHLY EFFICIENT SYSTEM TO CORRECT FOR NON-ANALYTE ABSORPTION WILL BE INVESTIGATED ON CDTE MATERIALS.

* Information listed above is at the time of submission. *

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