Electronic Power Supplies Prognosis Using Material Modeling and Simulation

Power supply failure can result in immediate JSF system shutdown. Power supply systems are highly susceptible to failure due to the high voltage and current conditions they routinely operate in. Mechanical system prognosis can take advantage ofconventional fault signals to be used as advanced indication of failure. Unfortunately these electronic systems do not display conventional fault signals prior to failure. JSF operational reliability could be greatly enhanced by ensuring power supplyperformance in fielded systems. Power supply prognosis would allow for component or subcomponent change-out as maintenance for cause. JSF OEMs have expressed interest in the possibility of using predicted material degradation of the electronic systemelements as a means for simulated fault detection. A power supply system is made up of component elements which can be further subdivided into component elements based on specific material characteristics. Predicted degradation within any single orcombination of component elements can be rolled up into an overall reliability prediction for the entire JSF power supply system. This SBIR will identify means for power supply prognosis using material-based system reliability analysis. The Phase I willfocus in on a particular JSF OEM power supply component failure concern.