USA flag logo/image

An Official Website of the United States Government

Company Information:

Company Name:
Uncopiers, Inc.
Address:
910 Poyntz Ave
Manhattan, KS 66502-0000
Phone:
(785) 317-4949
URL:
N/A
EIN:
481222811
DUNS:
80880557
Number of Employees:
7
Woman-Owned?:
Yes
Minority-Owned?:
Yes
HUBZone-Owned?:
Yes

Commercialization:

Has been acquired/merged with?:
N/A
Has had Spin-off?:
N/A
Has Had IPO?:
N/A
Year of IPO:
N/A
Has Patents?:
N/A
Number of Patents:
N/A
Total Sales to Date $:
$ 0.00
Total Investment to Date $
$ 0.00
POC Title:
N/A
POC Name:
N/A
POC Phone:
N/A
POC Email:
N/A
Narrative:
N/A

Award Totals:

Program/Phase Award Amount ($) Number of Awards
SBIR Phase I $1,169,999.00 12
SBIR Phase II $2,397,345.00 5

Award List:

ACIM Assisted Selective Depainting and Precision Cleaning of Delicate Surfaces

Award Year / Program / Phase:
1999 / SBIR / Phase I
Award Amount:
$69,999.00
Agency / Branch:
DOD / NAVY
Principal Investigator:
Isabel Zambrano
Abstract:
Not Available The primary goal of Phase I work will be to demonstrate the feasibility of growing high quality, high purity, stoichiometric ZnO bulk crystals from a seeded melt. The secondary goal will be to stabilize the ZnO, thereby improving the stability of the ZnO lattice in reducing… More

Uncopying Xerox

Award Year / Program / Phase:
1999 / SBIR / Phase I
Award Amount:
$100,000.00
Agency:
NSF
Principal Investigator:
William Taft
Abstract:
N/a

Removal Tools and Process for LO Materials

Award Year / Program / Phase:
2001 / SBIR / Phase I
Award Amount:
$100,000.00
Agency / Branch:
DOD / USAF
Principal Investigator:
Sameer Madanshetty, Chief R&D Officer
Abstract:
This phase-I effort seeks to demonstrate the feasibility of developing a coating removal method based on a novel, environmentally-friendly (chemical-free and energy efficient) technology known as Acoustic Coaxing Induced Microcavitation (ACIM). InACIM-based technologies silent sound is used to… More

N/A

Award Year / Program / Phase:
2001 / SBIR / Phase I
Award Amount:
$0.00
Agency:
NSF
Principal Investigator:
Abstract:
This Small Business Innovation Research (SBIR) Phase II project will develop an optimized prototype of the UNCOPIER-a chemical-free, energy-efficient, ACIM-based device designed to non-destructively deink laser-xerographic prints one sheet at a time. Acoustic Coaxing Induced Microcavitation (ACIM)… More

N/A

Award Year / Program / Phase:
2001 / SBIR / Phase II
Award Amount:
$397,345.00
Agency:
NSF
Principal Investigator:
Abstract:
This Small Business Innovation Research (SBIR) Phase II project will develop an optimized prototype of the UNCOPIER-a chemical-free, energy-efficient, ACIM-based device designed to non-destructively deink laser-xerographic prints one sheet at a time. Acoustic Coaxing Induced Microcavitation (ACIM)… More

SBIR Phase I: Saving post-CMP Wafers using ACIM

Award Year / Program / Phase:
2001 / SBIR / Phase I
Award Amount:
$100,000.00
Agency:
NSF
Principal Investigator:
Abstract:
This Small Business Innovation Research (SBIR) Phase I project is to save semiconductor wafers from being deeply scratched by unchecked large errant particles in chemical mechanical planarizing or polishing (CMP) slurries. CMP has become the method of choice for restoring the surface trueness of… More

SBIR Phase I: ACIM deBonder: Thin Film Integrity Testing using controlled microcavitation

Award Year / Program / Phase:
2003 / SBIR / Phase I
Award Amount:
$100,000.00
Agency:
NSF
Principal Investigator:
Sameer Madanshetty
Abstract:
This Small Business Innovation Research (SBIR) Phase I project will develop a new method of measuring how strongly a thin film anchors to its substrate. To date no method exists that can truly measure thin film adhesion. The Acoustic Coaxing Induced Microcaviation (ACIM) deBonder uses controlled… More

SBIR Phase I: ACIM Wafer Saver: A novel CMP slurry monitor

Award Year / Program / Phase:
2003 / SBIR / Phase I
Award Amount:
$100,000.00
Agency:
NSF
Principal Investigator:
Sameer Madanshetty
Abstract:
This Small Business Innovation Research Phase I project is targeted to save semiconductor wafers from being deeply scratched by unchecked large errant agglomerates in chemical mechanical planarizing or polishing (CMP) slurries. CMP has become the method of choice for restoring the surface trueness… More

SBIR Phase II: ACIM deBonder: Thin Film Integrity Testing Using Controlled Microcavitation

Award Year / Program / Phase:
2004 / SBIR / Phase II
Award Amount:
$500,000.00
Agency:
NSF
Principal Investigator:
Abstract:
This Small Business Innovation Research (SBIR) Phase II project will develop a new method of determining how strong a thin film anchors to a substrate. The ACIM deBonder(trade mark)uses controlled microcavitation to directly reveal a thin film's adhesion strength by subjecting it to controlled… More

SBIR Phase I: A Quality Monitor for Enabling Water Recycling in Semiconductor Processing - The Particle Scout

Award Year / Program / Phase:
2005 / SBIR / Phase I
Award Amount:
$100,000.00
Agency:
NSF
Principal Investigator:
Abstract:
This Small Business Innovation Research (SBIR) Phase I project concerns Ultrapure Water (UPW), the lifeblood of the semiconductor industry. The proposed instrument seeks to satisfy the International Technology Roadmap for Semiconductors (ITRS) requirements on two counts: 1. full flow inspections, 2.… More

SBIR Phase I: An Innovative Method for Removing Resist from Wafers

Award Year / Program / Phase:
2006 / SBIR / Phase I
Award Amount:
$100,000.00
Agency:
NSF
Principal Investigator:
Abstract:
This Small Business Innovation Research (SBIR) Phase I Project seeks to develop an innovative method for removing resist from semiconductor wafers. The Microcavitation Resist Remover will help enable the low-k integration critical to the next generation of faster chips. Microcavitation will be a… More

SBIR Phase II: A Quality Monitor for Enabling Water Recycling in Semiconductor Processing - The Particle Scout

Award Year / Program / Phase:
2007 / SBIR / Phase II
Award Amount:
$500,000.00
Agency:
NSF
Principal Investigator:
Abstract:
This Small Business Innovation Research (SBIR) Phase II Project concerns Ultrapure Water (UPW), the life blood of the semiconductor industry. The proposed instrument seeks to satisfy the ITRS requirements on two counts: 1. full flow inspection, and 2. detection of sub-100nm liquid-borne particles.… More

SBIR Phase I: CMP Slurry Monitor

Award Year / Program / Phase:
2008 / SBIR / Phase I
Award Amount:
$100,000.00
Agency:
NSF
Principal Investigator:
Abstract:
This SBIR Phase I project is to develop a Chemical Mechanical Polishing (CMP) Slurry Monitor as a fully in-line, real-time, point of use instrument that will detect and disperse large agglomerates in the nanofine slurries used in IC manufacture. The monitor will not only detect scratch inducing… More

SBIR Phase II: An Innovative Method for Removing Resist from Wafers

Award Year / Program / Phase:
2008 / SBIR / Phase II
Award Amount:
$500,000.00
Agency:
NSF
Principal Investigator:
Hang Ji, PhD
Abstract:
The Small Business Innovation Research (SBIR) Phase II project seeks to develop an innovative, environment friendly method for removing resist from semiconductor wafers. After every lithography step, and the following processing step, e.g., etching or ion implantation, the process-hardened resist… More

SBIR Phase I: Clean Tool: A unified approach to wafer cleaning

Award Year / Program / Phase:
2010 / SBIR / Phase I
Award Amount:
$150,000.00
Agency:
NSF
Principal Investigator:
Abstract:
This Small Business Innovation Research (SBIR) Phase I project, will develop a new kind of wafer cleaning tool that will be useful at every cleaning step in semiconductor processing. It will use an environmentally friendly, acoustic technology that uses only clean water and silent sound. The tool… More

SBIR Phase I: Acoustic Slurry Monitor

Award Year / Program / Phase:
2011 / SBIR / Phase I
Award Amount:
$150,000.00
Agency:
NSF
Principal Investigator:
Abstract:
This SBIR Phase-I project is to develop an acoustic CMP (Chemical Mechanical Polishing) slurry monitor?a fully in-line, real-time, point of use instrument that will detect and disperse any and all large agglomerates in the nanofine slurries used in IC manufacture. Left unchecked, these errant slurry… More

SBIR Phase II: Clean Tool: A unified approach to wafer cleaning

Award Year / Program / Phase:
2012 / SBIR / Phase II
Award Amount:
$500,000.00
Agency:
NSF
Principal Investigator:
Abstract:
This Small Business Innovation Research (SBIR) Phase II project aims to develop a single wafer processing clean tool for semiconductor wafer cleaning at all stages of wafer processing. The method relies on using acoustically controlled micro-cavitation to remove on-wafer particles. This is a… More