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LOW WORK FUNCTION SURFACES BY ION BEAM TECHNIQUES

Award Information
Agency: National Science Foundation
Branch: N/A
Contract: N/A
Agency Tracking Number: 7589
Amount: $50,000.00
Phase: Phase I
Program: SBIR
Solicitation Topic Code: N/A
Solicitation Number: N/A
Timeline
Solicitation Year: N/A
Award Year: 1988
Award Start Date (Proposal Award Date): N/A
Award End Date (Contract End Date): N/A
Small Business Information
Patriots Park
Bedford, MA 01730
United States
DUNS: N/A
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 DR WARD HALVERSON
 () -
Business Contact
Phone: () -
Research Institution
N/A
Abstract

HIGH YIELD SECONDARY ELECTRON SURFACES HOLD PROMISE FOR IMPROVED ELECTRON MULTIPLYING DEVICES SUCH AS PHOTOMULTIPLIERS AND MICROCHANNEL PLATES. ION IMPLANTATION AND ION BEAM MIXING OFFER A DIRECT MEANS OF ALLOYING LOW WORK FUNCTION ELEMENTS INTO THE NEAR SURFACE REGION OF SUBSTRATES. PRELIMINARY WORK HAS SHOWN PROMISE AND THE PROPOSED EFFORTS WILL TEST THE FEASIBILITY OF PRODUCING STABLE LONG-LIVED WORK FUNCTION SURFACES BY DIRECT ION IMPLANTATION AND ION BEAM MIXING OF SELECTED ELEMENTS (E.G.,BA AND CS) INTO ELECTRON EMITTING SURFACES.

* Information listed above is at the time of submission. *

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