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MODE EXCITATION ANALYSIS OF VACUUM ELECTRONICS DEVICES
Phone: (703) 750-3556
WE PROPOSE TO INVESTIGATE A NEW METHOD FOR COMPUTING MODE EXCITATION RATES WITHIN VACUUM ELECTRONICS DEVICES. THIS METHOD UTILIZES THE MUTUAL ORTHOGONALITY OF EIGEN-FUNCTION AND COMBINES TIME-DOMAIN AND FREQUENCY-DOMAIN ANALYSIS. THE METHOD WILL PREDICT THE GROWTH OF ELECTROMAGNETIC MODES AS A FUNCTION OF TIME AND OF DEVICE OPERATING PARAMETERS. IT REQUIRES NUMERICAL SOLUTION OF THE COMPLETE SET OF MAXWELL'S EQUATIONS IN THREE-DIMENSIONS WITH BOUNDARY CONDITIONS DETERMINED FROM THE DEVICE GEOMETRY, AND IS EQUALLY APPLICABLE TO COLDTEST AND PARTICLE BEAM OPERATION. BECAUSE THIS APPROACH RELIES ON BASIC PHYSICS PRINCIPLES, IT IS POTENTIALLY MORE GENERAL IN APPLICATION THAN THE NUMEROUS SPECIAL-PURPOSE (E.G., CIRCUIT MODEL) CODES PRESENTLY IN USE BY INDUSTRY. THIS RESEARCH WILL ALLOW US TO EXPLOIT THE BEST FEATURES OF TIME-DOMAIN AND FREQUENCY-DOMAIN ANALYSIS. WE PROPOSE TO: (1) ANALYZE THE ORTHOGONALITY ALGORITHM REQUIREMENTS FOR ACCURACY AND SPEED, (2) DEMONSTRATE ON A REALISTIC OR ACTUAL DEVICE SUCH AS A CCTWT, AND (3) EVALUATE THE POTENTIAL FOR TECHNOLOGY TRANSFER TO INDUSTRY AND COMMERCIAL APPLICATIONS.
* Information listed above is at the time of submission. *