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Gallium Nitride Epitaxial Growth on Aluminum Nitride Substrates

Award Information
Agency: Department of Defense
Branch: Missile Defense Agency
Contract: DASG60-01-P-0035
Agency Tracking Number: 01-0552
Amount: $70,000.00
Phase: Phase I
Program: SBIR
Solicitation Topic Code: N/A
Solicitation Number: N/A
Timeline
Solicitation Year: N/A
Award Year: 2001
Award Start Date (Proposal Award Date): N/A
Award End Date (Contract End Date): N/A
Small Business Information
8829 Midway West Road
Raleigh, NC 27613
United States
DUNS: 020080607
HUBZone Owned: No
Woman Owned: No
Socially and Economically Disadvantaged: No
Principal Investigator
 N.Mark Williams
 Director of R&D
 (919) 789-8880
 williams@kymatech.com
Business Contact
 Edward Pupa
Title: President and CEO
Phone: (919) 789-8880
Email: epupa@kymatech.com
Research Institution
N/A
Abstract

This program will develop a process for growth of low defect density GaN epitaxial layer on aluminum nitride substrates. Utilizing a novel high rate material transfer process, thick, low defect density, free-standing AlN substrates will be fabricated byKyma Technologies. The nitride MOVPE growth process will be employed to grow gallium nitride epitaxial layers on this substrate material. The AlN substrate has structural and thermal properties that will improve gallium nitride (GaN) and AlGaN layers inthe device structure. This will allow the production of low defect density thin films. This project will utilize parallel efforts of materials development, device fabrication and characterization. The initial focus in this program will be thedevelopment of simple p-n optoelectronic devices operating in the important wavelength range of < 450 nm, where the greatest interest for commercial and military based applications exists. The accomplishment of low-dislocation-density GaN material willincrease lifetime and brightness in optoelectronic devices. These improvements should improve the commercialization of the devices in many markets.Gallium nitride thin films are the building blocks for many commercial devices. Low defect density galliumnitride films will benefit many microelectronic and optoelectronic devices. This could lead to the commercialization of blue lasers in data storage and solid state white LED lighting. Heteroepitaxial growth of gallium nitride on single crystal aluminumnitride substrates will result in improved device performance such as increased lifetime and brightness in optoelectronics and increase power and frequency in microelectronic devices.

* Information listed above is at the time of submission. *

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