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Company Information:

Company Name:
NAUGANEEDLES
Address:
11300 Decimal Dr.
Louisville
Louisville, KY 40299-2444
Phone:
N/A
URL:
N/A
EIN:
111381762
DUNS:
799015305
Number of Employees:
N/A
Woman-Owned?:
No
Minority-Owned?:
No
HUBZone-Owned?:
No

Commercialization:

Has been acquired/merged with?:
N/A
Has had Spin-off?:
N/A
Has Had IPO?:
N/A
Year of IPO:
N/A
Has Patents?:
N/A
Number of Patents:
N/A
Total Sales to Date $:
$ 0.00
Total Investment to Date $
$ 0.00
POC Title:
N/A
POC Name:
N/A
POC Phone:
N/A
POC Email:
N/A
Narrative:
N/A

Award Totals:

Program/Phase Award Amount ($) Number of Awards
SBIR Phase I $200,000.00 1
SBIR Phase II $500,000.00 1
STTR Phase I $157,770.00 1

Award List:

Ultra-soft atomic force microscope (USAFM) technology using nano-cantilevers for

Award Year / Program / Phase:
2009 / STTR / Phase I
Award Amount:
$157,770.00
Agency:
HHS
Principal Investigator:
Mehdi M. Yazdanpanah
Research Institution:
PURDUE UNIVERSITY
RI Contact:
N/A
Abstract:
DESCRIPTION (provided by applicant): NaugaNeedles LLC in collaboration with researchers from Purdue University are proposing to develop an advanced new Ultra-Soft Atomic Force Microscope (USAFM). This USAFM can gently create images of soft biological sampl es in buffer solutions with sub-picoNewton… More

SBIR Phase I: Batch Fabrication of High Aspect Ratio Metallic AFM Probes

Award Year / Program / Phase:
2010 / SBIR / Phase I
Award Amount:
$200,000.00
Agency:
NSF
Principal Investigator:
Abstract:
This Small Business Innovation Research Phase I project is to demonstrate the feasibility of batch fabricating high-aspect ratio atomic force microscopy (AFM) probes. These probes have excellent mechanical and electrical properties and are customizable to a wide range of applications and… More

SBIR Phase II: Batch Fabrication of High Aspect Ratio Metallic AFM Probes

Award Year / Program / Phase:
2011 / SBIR / Phase II
Award Amount:
$500,000.00
Agency:
NSF
Principal Investigator:
Abstract:
This Small Business Innovation Research (SBIR) Phase II project aims to develop a low-cost manufacturing process to produce conductive and high-aspect-ratio probes for atomic force microscopy (AFM). A new fabrication tool with high-precision alignment and in-situ process monitoring sensors will be… More