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Company Information:

Company Name: NanoTEM
City: Scottsdale
State: AZ
Zip+4: 85258-
Woman-Owned: No
Minority-Owned: No
HUBZone-Owned: No
Website URL: http://www.nanotem.com
Phone: (602) 243-5374

Award Totals:

Program/Phase Award Amount ($) Number of Awards
SBIR Phase I $199,995.00 2
SBIR Phase II $2,719,088.00 3

Award List:

VLWIR HgCdTe FPA Reliability and Yield Enhancement through Nanostructural Analysis

Award Year / Program / Phase: 2009 / SBIR / Phase I
Agency / Branch: DOD / MDA
Principal Investigator: Fred Shaapur, Principal Scientist
Award Amount: $99,998.00
Abstract:
This Phase I proposal seeks to demonstrate the feasibility of characterizing the depletion region of a VLWIR HgCdTe photodiode in plan-view and in nano-scale to detect and study the structural anomalies responsible for the current leakage and other operability issues. Our related preliminary work… More

A Rapid and Cost-Effective Approach to Nanostructural Analysis of Semiconductor Devices

Award Year / Program / Phase: 2009 / SBIR / Phase I
Agency / Branch: DOD / USAF
Principal Investigator: Fred Shaapur, Principal Scientist
Award Amount: $99,997.00
Abstract:
Phase I proposal focuses on the demonstration of the feasibility to improve the efficiency and to lower the cost associated with nanostructural analysis of semiconductor devices by implementing a two-pronged strategy. The proposed methodology combines streamlining the required specimen preparation… More

A Rapid and Cost-Effective Approach to Nanostructural Analysis of Semiconductor Devices

Award Year / Program / Phase: 2010 / SBIR / Phase II
Agency: DOD
Principal Investigator: Fred Shaapur, Principal – (602) 243-5374
Award Amount: $736,328.00
Abstract:
An expedited and economical nanostructural sampling and analysis of semiconductor devices will be crucial to accelerated product development and rapid introduction of these technologies to the market with a higher quality at a lower cost. The proposed effort aims to carry out the next phase of… More

VLWIR HgCdTe FPA Reliability and Yield Enhancement through Nanostructural Analysis

Award Year / Program / Phase: 2010 / SBIR / Phase II
Agency / Branch: DOD / MDA
Principal Investigator: Fred Shaapur, Principal Scientist
Award Amount: $983,746.00
Abstract:
The state-of-the-art FPA manufacturing technologies commonly generate some critical defects in the pixel elements, which adversely impact their operability and reliability. In Phase I, the feasibility of identifying, analyzing, and on exemplary basis, eliminating these defects indirectly through… More

Electronic Component Fingerprinting to Determine Manufacturing Origin

Award Year / Program / Phase: 2014 / SBIR / Phase II
Agency / Branch: DOD / DARPA
Principal Investigator: Fred Shaapur, President – (602) 410-5840
Award Amount: $999,014.00
Abstract:
In the area of supply chain integrity improvement, the US defense and intelligence sectors anticipate multiple uses for the forensic capability to characterize an electronic component for the purpose of identifying the semiconductor fabrication facility w