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Company Information:

Company Name:
NanoTEM
Address:
7702 E. Doubletree Ranch Rd.
Ste. 300
Scottsdale, AZ 85258-
Phone:
(602) 243-5374
URL:
EIN:
860709341
DUNS:
868448846
Number of Employees:
5
Woman-Owned?:
No
Minority-Owned?:
No
HUBZone-Owned?:
No

Commercialization:

Has been acquired/merged with?:
N/A
Has had Spin-off?:
N/A
Has Had IPO?:
N/A
Year of IPO:
N/A
Has Patents?:
N/A
Number of Patents:
N/A
Total Sales to Date $:
$ 0.00
Total Investment to Date $
$ 0.00
POC Title:
N/A
POC Name:
N/A
POC Phone:
N/A
POC Email:
N/A
Narrative:
N/A

Award Totals:

Program/Phase Award Amount ($) Number of Awards
SBIR Phase I $199,995.00 2
SBIR Phase II $2,719,088.00 3

Award List:

VLWIR HgCdTe FPA Reliability and Yield Enhancement through Nanostructural Analysis

Award Year / Program / Phase:
2009 / SBIR / Phase I
Award Amount:
$99,998.00
Agency / Branch:
DOD / MDA
Principal Investigator:
Fred Shaapur, Principal Scientist
Abstract:
This Phase I proposal seeks to demonstrate the feasibility of characterizing the depletion region of a VLWIR HgCdTe photodiode in plan-view and in nano-scale to detect and study the structural anomalies responsible for the current leakage and other operability issues. Our related preliminary work… More

A Rapid and Cost-Effective Approach to Nanostructural Analysis of Semiconductor Devices

Award Year / Program / Phase:
2009 / SBIR / Phase I
Award Amount:
$99,997.00
Agency / Branch:
DOD / USAF
Principal Investigator:
Fred Shaapur, Principal Scientist
Abstract:
Phase I proposal focuses on the demonstration of the feasibility to improve the efficiency and to lower the cost associated with nanostructural analysis of semiconductor devices by implementing a two-pronged strategy. The proposed methodology combines streamlining the required specimen preparation… More

A Rapid and Cost-Effective Approach to Nanostructural Analysis of Semiconductor Devices

Award Year / Program / Phase:
2010 / SBIR / Phase II
Award Amount:
$736,328.00
Agency:
DOD
Principal Investigator:
Fred Shaapur, Principal – (602) 243-5374
Abstract:
An expedited and economical nanostructural sampling and analysis of semiconductor devices will be crucial to accelerated product development and rapid introduction of these technologies to the market with a higher quality at a lower cost. The proposed effort aims to carry out the next phase of… More

VLWIR HgCdTe FPA Reliability and Yield Enhancement through Nanostructural Analysis

Award Year / Program / Phase:
2010 / SBIR / Phase II
Award Amount:
$983,746.00
Agency / Branch:
DOD / MDA
Principal Investigator:
Fred Shaapur, Principal Scientist
Abstract:
The state-of-the-art FPA manufacturing technologies commonly generate some critical defects in the pixel elements, which adversely impact their operability and reliability. In Phase I, the feasibility of identifying, analyzing, and on exemplary basis, eliminating these defects indirectly through… More

Electronic Component Fingerprinting to Determine Manufacturing Origin

Award Year / Program / Phase:
2014 / SBIR / Phase II
Award Amount:
$999,014.00
Agency / Branch:
DOD / DARPA
Principal Investigator:
Fred Shaapur, President – (602) 410-5840
Abstract:
In the area of supply chain integrity improvement, the US defense and intelligence sectors anticipate multiple uses for the forensic capability to characterize an electronic component for the purpose of identifying the semiconductor fabrication facility w