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Company Information:

Company Name:
k-Space Associates, Inc.
Address:
2182 Bishop Circle East
Dexter, MI 48130
Phone:
N/A
URL:
EIN:
383059777
DUNS:
801558578
Number of Employees:
22
Woman-Owned?:
No
Minority-Owned?:
No
HUBZone-Owned?:
No

Commercialization:

Has been acquired/merged with?:
N/A
Has had Spin-off?:
N/A
Has Had IPO?:
N/A
Year of IPO:
N/A
Has Patents?:
N/A
Number of Patents:
N/A
Total Sales to Date $:
$ 0.00
Total Investment to Date $
$ 0.00
POC Title:
N/A
POC Name:
N/A
POC Phone:
N/A
POC Email:
N/A
Narrative:
N/A

Award Totals:

Program/Phase Award Amount ($) Number of Awards
SBIR Phase I $69,571.00 1
SBIR Phase II $723,505.00 1

Award List:

In-situ Stress and Temperature Optical Monitoring for low-cost heteroepitaxial substrates for HgCdTe infrared detectors.

Award Year / Program / Phase:
2010 / SBIR / Phase I
Award Amount:
$69,571.00
Agency / Branch:
DOD / ARMY
Principal Investigator:
Charles Taylor, Product Development Manager
Abstract:
The feasibility of an in-situ, real-time, non-contact system for optically monitoring temperature in the range 25-800C on Si, GaAs, and CdTe-buffered Si/GaAs substrates will be demonstrated. Real-time measurement of thin-film stress and surface reflectivity during deposition on these substrates,… More

In-situ Stress and Temperature Optical Monitoring for low-cost heteroepitaxial substrates for HgCdTe infrared detectors.

Award Year / Program / Phase:
2011 / SBIR / Phase II
Award Amount:
$723,505.00
Agency:
DOD
Principal Investigator:
Charles Taylor, Product Development Manag – (734) 426-7977
Abstract:
An integrated, in-situ, real-time, optical metrology system will be developed to measure temperature, film stress and reflectivity during CdTe and HgCdTe-based deposition applications. Temperature measurement will be performed using band-edge thermometry and blackbody radiation analysis to provide a… More