You are here

Cascade Microtech, Inc.

Company Information
Address
14255 SW BRIGADOON COURT
Beaverton, OR 97005
United States



Information

UEI: N/A

# of Employees: N/A


Ownership Information

HUBZone Owned: No

Socially and Economically Disadvantaged: No

Woman Owned: No



Award Charts




Award Listing

  1. On-Wafer Measurement Accuracy Assessment Tool Kit

    Amount: $49,848.00

    The traceability of on-wafer calibration standards has long been an issue among the microwave measurement community, and the proliferation of new calibration methods, elements, and applications only e ...

    SBIRPhase I1995Department of Commerce
  2. APPLICATION OF GIGAHERTZ WAFER PROBE TECHNOLOGY TO MULTICHIP MODULE PRODUCTION

    Amount: $246,913.00

    ADAPTATION OF STATE-OF-THE-ART GIGAHERTZ WAFER PROBE TECHNOLOGY (WPT) FOR USE IN DESIGN, TROUBLESHOOTING, AND PRODUCTION OF MULTICHIP MODULES (MCMS) IS PROPOSED. THESE PROBES ARE CURRENTLY CAPABLE OF ...

    SBIRPhase II1993Department of Defense Defense Advanced Research Projects Agency
  3. LOW-LOSS MICROWAVE PROBES FOR NOISE PARAMETER MEASUREMENTS

    Amount: $49,999.00

    NOISE PARAMETER MEASUREMENTS OF MICROWAVE TRANSISTORS AND MMICS ARE BEST PERFORMED WITH ON-WAFER, PROBE SYSTEMS. TWO KEY PARAMETERS OF THESE SYSTEMS IS THE LOSS FROM THE INPUT TUNER TO THE DEVICE UNDE ...

    SBIRPhase I1991Department of Defense Air Force
  4. APPLICATION OF GIGAHERTZ WAFER PROBE TECHNOLOGY TO MULTICHIP MODULE PRODUCTION

    Amount: $47,609.00

    N/A

    SBIRPhase I1991Department of Defense Defense Advanced Research Projects Agency
  5. 110 GHZ ON-WAFER MEASUREMENTS AND ELEMENT MODELING

    Amount: $49,961.00

    ON-WAFER MICROWAVE PROBE MEASUREMENTS HAVE DEMONSTRATED THEIR UNIQUE PERFORMANCE AND PRODUCTIVITY GAINS IN SEMICONDUCTOR RESEARCH, DEVELOPMENT AND PRODUCTION ACTIVITIES. HOWEVER, DEVICE PERFORMANCE CO ...

    SBIRPhase I1990Department of Defense Defense Advanced Research Projects Agency
  6. MULTI-GIGAHERTZ BANDWIDTH HIGH PINOUT DENSITY WAFER PROBE

    Amount: $49,866.00

    A MEMBRANE TYPE WAFER PROBE IS PROPOSED WHICH, AT THE END OF PHASE II, WILL ACHIEVE TRANSMISSION OF SIGNALS FROM TESTER TO DIE WITH LOW ABBRATIONS FOR A 100 PS RISETIME. CAPABILITIES WILL INCLUDE LOW- ...

    SBIRPhase I1989Department of Defense Defense Advanced Research Projects Agency
  7. HIGH ACCURACY CHARACTERIZATION OF MONOLITHIC MILLIMETER-WAVEDEVICES

    Amount: $49,737.00

    MAKING ACCURATE ON WAFER MEASUREMENTS OF MILLIMETER WAVE SEMICONDUCTOR DEVICES AND CIRCUIT ELEMENTS IS A FUNDAMENTAL REQUIREMENT FOR THE ADVANCEMENT OF MILLIMETER WAVE TECHNOLOGY. MILLIMETER WAVE WAFE ...

    SBIRPhase I1987National Aeronautics and Space Administration
  8. NONINVASIVE ELECTRO-OPTIC PROBING FOR MMIC

    Amount: $120,730.00

    THERE IS AN IMPLICIT NEED FOR THE ABILITY TO PROBE INTERNAL NODES IN GAAS MMIC'S TO FACILITATE DEVELOPMENT OF THESE STRATEGICALLY CRITICAL COMPONENTS. SYSTEMS USING THE ELECTRO-OPTIC EFFECT HAVE DEMON ...

    SBIRPhase I1987Department of Defense Air Force
  9. LOW LOSS MILLIMETER-WAVE SEMICONDUCTOR WAFER PROBES

    Amount: $57,489.00

    MAKING ACCURATE AUTOMATED ON-WAFER MEASUREMENTS OF MILLIMETER-WAVE SEMICONDUCTOR DEVICES AND CIRCUIT ELEMENTS IS A FUNDAMENTAL REQUIREMENT FOR THE ADVANCEMENT OF A MILLIMETER-WAVE TECHNOLOGY. MILLIMET ...

    SBIRPhase I1987Department of Defense Army
US Flag An Official Website of the United States Government